دورية أكاديمية
Elemental depth profiling in transparent conducting oxide thin film by X-ray reflectivity and grazing incidence X-ray fluorescence combined analysis
| العنوان: | Elemental depth profiling in transparent conducting oxide thin film by X-ray reflectivity and grazing incidence X-ray fluorescence combined analysis |
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| المؤلفون: | Rotella, H., Caby, B., Ménesguen, Y., Mazel, Y., Valla, A., Ingerle, D., Detlefs, B., Lépy, M.-C., Novikova, A., Rodriguez, G., Streli, C., Nolot, E. |
| المصدر: | In Spectrochimica Acta Part B: Atomic Spectroscopy 1 September 2017 135:22-28 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 05848547 |
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| DOI: | 10.1016/j.sab.2017.06.011 |