دورية أكاديمية
Remaining useful life prediction for stochastic degrading devices incorporating quantization
| العنوان: | Remaining useful life prediction for stochastic degrading devices incorporating quantization |
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| المؤلفون: | Zhang, Jian-Xun, Zhang, Jia-Ling, Zhang, Zheng-Xin, Li, Tian-Mei, Si, Xiao-Sheng |
| المصدر: | In Reliability Engineering and System Safety October 2024 250 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 09518320 |
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| DOI: | 10.1016/j.ress.2024.110223 |