دورية أكاديمية
Advanced characterization of SiC devices by optical beam induced current (OBIC): Experimental and simulation results
| العنوان: | Advanced characterization of SiC devices by optical beam induced current (OBIC): Experimental and simulation results |
|---|---|
| المؤلفون: | Planson, Dominique, Tournier, Dominique, Sonneville, Camille, Bevilacqua, Pascal, Viet Phung, Luong, Morel, Hervé |
| المصدر: | In Materials Science in Semiconductor Processing 1 August 2024 178 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 13698001 |
|---|---|
| DOI: | 10.1016/j.mssp.2024.108444 |