دورية أكاديمية

Residual stress distribution of silicon wafers machined by rotational grinding based on molecular dynamics

التفاصيل البيبلوغرافية
العنوان: Residual stress distribution of silicon wafers machined by rotational grinding based on molecular dynamics
المؤلفون: Liu, Haijun, Zhang, Qilong, Zhou, Jing, Tian, Xiaoqing, Chen, Shan, Dong, Fangfang, Han, Jiang
المصدر: In Journal of Manufacturing Processes 15 June 2024 119:565-573
قاعدة البيانات: ScienceDirect
الوصف
تدمد:15266125
DOI:10.1016/j.jmapro.2024.04.007