دورية أكاديمية

Low Stress Encapsulants? Influence of Encapsulation Materials on Stress and Fracture of Thin Silicon Solar Cells as Revealed by Synchrotron X-ray Submicron Diffraction

التفاصيل البيبلوغرافية
العنوان: Low Stress Encapsulants? Influence of Encapsulation Materials on Stress and Fracture of Thin Silicon Solar Cells as Revealed by Synchrotron X-ray Submicron Diffraction
المؤلفون: Rengarajan, Karthic Narayanan, Radchenko, Ihor, Illya, Gregoria, Handara, Vincent, Kunz, Martin, Tamura, Nobumichi, Budiman, Arief Suriadi
المصدر: In Procedia Engineering 2016 139:76-86
قاعدة البيانات: ScienceDirect
الوصف
تدمد:18777058
DOI:10.1016/j.proeng.2015.09.230