دورية أكاديمية
Synchrotron X-ray Micro-diffraction – Probing Stress State in Encapsulated Thin Silicon Solar Cells
| العنوان: | Synchrotron X-ray Micro-diffraction – Probing Stress State in Encapsulated Thin Silicon Solar Cells |
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| المؤلفون: | Tippabhotla, Sasi Kumar, Radchenko, Ihor, Rengarajan, Karthic Narayanan, Illya, Gregoria, Handara, Vincent, Kunz, Martin, Tamura, Nobumichi, Budiman, Arief Suriadi |
| المصدر: | In Procedia Engineering 2016 139:123-133 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 18777058 |
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| DOI: | 10.1016/j.proeng.2015.09.241 |