دورية أكاديمية
Z-Scan theory for thin film measurements: Validation of a model beyond the standard approach using ITO and HfO[formula omitted]
| العنوان: | Z-Scan theory for thin film measurements: Validation of a model beyond the standard approach using ITO and HfO[formula omitted] |
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| المؤلفون: | Tognazzi, Andrea, Franceschini, Paolo, Tran, Thi Ngoc Lam, Chiasera, Alessandro, Vincenti, Maria Antonietta, Cino, Alfonso Carmelo, Akozbek, Neset, Scalora, Michael, De Angelis, Costantino |
| المصدر: | In Optical Materials: X July 2023 19 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 25901478 |
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| DOI: | 10.1016/j.omx.2023.100242 |