دورية أكاديمية
Review on the degradation of GaN-based lateral power transistors
| العنوان: | Review on the degradation of GaN-based lateral power transistors |
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| المؤلفون: | De Santi, C., Buffolo, M., Rossetto, I., Bordignon, T., Brusaterra, E., Caria, A., Chiocchetta, F., Favero, D., Fregolent, M., Masin, F., Modolo, N., Nardo, A., Piva, F., Rampazzo, F., Sharma, C., Trivellin, N., Zhan, G., Meneghini, M., Zanoni, E., Meneghesso, G. |
| المصدر: | In e-Prime - Advances in Electrical Engineering, Electronics and Energy 2021 1 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 27726711 |
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| DOI: | 10.1016/j.prime.2021.100018 |