كتاب
Dielectric measurements using a reentrant cavity: mode-matching analysis
| العنوان: | Dielectric measurements using a reentrant cavity: mode-matching analysis |
|---|---|
| المؤلفون: | Baker-Jarvis, James. |
| المساهمون: | Riddle, Bill F., National Institute of Standards and Technology (U.S.) |
| بيانات النشر: | Boulder, Colo. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1996. |
| سنة النشر: | 1996 |
| وصف مادي: | 13 p. : ill. |
| سلاسل: | NIST technical note NIST technical note |
| مصطلحات موضوعية: | Dielectric measurements. |
| Original Identifier: | ocm40166482 |
| نوع الوثيقة: | Book |
| اللغة: | English |
| حقوق: | This record is part of the Harvard Library Bibliographic Dataset, which is provided by the Harvard Library under its Bibliographic Dataset Use Terms and includes data made available by, among others, OCLC Online Computer Library Center, Inc. and the Library of Congress. |
| ملاحظات: | Shipping list no.: 98-0938-M. Paper version no longer available for sale by the Supt. of Docs. "November 1996." Includes bibliographical references (p. 12-13). |
| رقم الأكسشن: | edshlc.007929716.1 |
| قاعدة البيانات: | Harvard Library Bibliographic Dataset |
| الوصف غير متاح. |