Crack healing in silicon nitride due to oxidation

التفاصيل البيبلوغرافية
العنوان: Crack healing in silicon nitride due to oxidation
المؤلفون: Choi, Sung R, Tikare, Veena, Pawlik, Ralph
المصدر: Ceramic Engineering and Science Proceedings. 12
بيانات النشر: United States: NASA Center for Aerospace Information (CASI), 1991.
سنة النشر: 1991
مصطلحات موضوعية: Nonmetallic Materials
الوصف: The crack healing behavior of a commercial, MgO-containing, hot pressed Si3N4 was studied as a function of temperature in oxidizing and inert annealing environments. Crack healing occurred at a temperature 800 C or higher due to oxidation regardless of crack size, which ranged from 100 microns (indentation crack) to 1.7 mm (SEPB precrack). The resulting strength and apparent fracture toughness increased at crack healing temperature by 100 percent and 300 percent, respectively. The oxide layer present in the crack plane was found to be highly fatigue resistant, indicating that the oxide is not solely silicate glass, but a mixture of glass, enstatite, and/or cristobalite that was insensitive to fatigue in a room temperature water environment.
نوع الوثيقة: Report
اللغة: English
تدمد: 0196-6219
URL الوصول: https://ntrs.nasa.gov/citations/19910072359
رقم الأكسشن: edsnas.19910072359
قاعدة البيانات: NASA Technical Reports