Two identical SP-HVDE trays were flown in the NASA 5.75-year LDEF (Long Duration Exposure Facility), one near the leading edge and the other near the trailing edge, in the LEO (low earth orbit) environment. Each experiment tray consisted of six assemblies with each made of Kapton dielectric samples of varying thicknesses (i.e., 2 mils, 3 mils, and 5 mils) biased under +/- 300 V, +/- 500 V, and +/- 1000 V. The objectives have been successfully achieved by measuring the first post-flight long-term (i.e. roughly 8-month experiment) average leakage current through 95 percent measurable coulombmeters and surface materials.
