مورد إلكتروني
Tunable Microwave Conductance of Nanodomains in Ferroelectric PbZr0.2Ti0.8O3 Thin Film
العنوان: | Tunable Microwave Conductance of Nanodomains in Ferroelectric PbZr0.2Ti0.8O3 Thin Film |
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المؤلفون: | Burns, SR |
المصدر: | Advanced Electronic Materials; vol 8, iss 3, 2100952-2100952; 2199-160X |
بيانات النشر: | eScholarship, University of California 2022-03-01 |
تفاصيل مُضافة: | Burns, SR Tselev, A Ievlev, AV Agar, JC Martin, LW Kalinin, SV Sando, D Maksymovych, P |
نوع الوثيقة: | Electronic Resource |
مستخلص: | Ferroelectric materials exhibit spontaneous polarization that can be switched by electric field. Beyond traditional applications as nonvolatile capacitive elements, the interplay between polarization and electronic transport in ferroelectric thin films has enabled a path to neuromorphic device applications involving resistive switching. A fundamental challenge, however, is that finite electronic conductivity may introduce considerable power dissipation and perhaps destabilize ferroelectricity itself. Here, tunable microwave frequency electronic response of domain walls injected into ferroelectric lead zirconate titanate (PbZr0.2Ti0.8O3) on the level of a single nanodomain is revealed. Tunable microwave response is detected through first-order reversal curve spectroscopy combined with scanning microwave impedance microscopy measurements taken near 3 GHz. Contributions of film interfaces to the measured AC conduction through subtractive milling, where the film exhibited improved conduction properties after removal of surface layers, are investigated. Using statistical analysis and finite element modeling, we inferred that the mechanism of tunable microwave conductance is the variable area of the domain wall in the switching volume. These observations open the possibilities for ferroelectric memristors or volatile resistive switches, localized to several tens of nanometers and operating according to well-defined dynamics under an applied field. |
مصطلحات الفهرس: | domain wall conductance, lead zirconate titanate, scanning microwave impedance microscopy, scanning probe microscopy, thin film, Electrical and Electronic Engineering, Materials Engineering, article |
URL: | |
الإتاحة: | Open access content. Open access content public |
ملاحظة: | application/pdf Advanced Electronic Materials vol 8, iss 3, 2100952-2100952 2199-160X |
أرقام أخرى: | CDLER oai:escholarship.org:ark:/13030/qt0463r4pz qt0463r4pz https://escholarship.org/uc/item/0463r4pz https://escholarship.org/ 1367391390 |
المصدر المساهم: | UC MASS DIGITIZATION From OAIster®, provided by the OCLC Cooperative. |
رقم الأكسشن: | edsoai.on1367391390 |
قاعدة البيانات: | OAIster |
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