كتاب إلكتروني
Failure Site Isolation: Photon Emission Microscopy Optical/Electron Beam Techniques
| العنوان: | Failure Site Isolation: Photon Emission Microscopy Optical/Electron Beam Techniques |
|---|---|
| المؤلفون: | Cole, Edward I., Jr.Aff2, Barton, Daniel L.Aff2 |
| المساهمون: | Wagner, Lawrence C., editorAff1 |
| المصدر: | Failure Analysis of Integrated Circuits : Tools and Techniques. 494:87-112 |
| Degree: | Ph.D. |
| قاعدة البيانات: | Springer Nature eBooks |
Full Text Finder | ردمك: | 9781461372318 9781461549192 |
|---|---|
| DOI: | 10.1007/978-1-4615-4919-2_6 |