كتاب إلكتروني

In Situ Characterization of XFEL Beam Intensity Distribution and Focusability by High-Resolution LiF Crystal Detector

التفاصيل البيبلوغرافية
العنوان: In Situ Characterization of XFEL Beam Intensity Distribution and Focusability by High-Resolution LiF Crystal Detector
المؤلفون: Pikuz, T. A.Aff5, Aff6, Faenov, A. Ya.Aff6, Aff7, Matsuoka, T.Aff7, Albertazzi, B.Aff5, Aff16, Ozaki, N.Aff5, Aff8, Hartely, N.Aff5, Muray Ricardo Arturo, O.Aff5, Aff8, Yabuuchi, T.Aff10, Habara, H.Aff5, Matsuyama, S.Aff5, Yamauchi, K.Aff5, Inubushi, Y.Aff9, Togashi, T.Aff9, Yumoto, H.Aff9, Tange, Y.Aff9, Tono, K.Aff9, Sato, Y.Aff5, Yabashi, M.Aff9, Aff10, Nishikino, M.Aff11, Kawachi, T.Aff11, Mitrofanov, A.Aff6, Pikuz, S. A.Aff6, Aff17, Bleiner, D.Aff12, Grum-Grzhimailo, A.Aff13, Rosanov, N. N.Aff14, Vysotina, N. V.Aff14, Harmand, M.Aff15, Koenig, M.Aff5, Aff16, Tanaka, K. A.Aff5, Ishikawa, T.Aff9, Aff10, Kodama, R.Aff5, Aff7, Aff8
المساهمون: Kawachi, Tetsuya, editorAff1, Bulanov, Sergei V., editorAff2, Daido, Hiroyuki, editorAff3, Kato, Yoshiaki, editorAff4
المصدر: X-Ray Lasers 2016 : Proceedings of the 15th International Conference on X-Ray Lasers. 202:109-115
قاعدة البيانات: Springer Nature eBooks
الوصف
ردمك:9783319730240
9783319730257
DOI:10.1007/978-3-319-73025-7_17