كتاب إلكتروني
Structural Characterisation of Quantum Dots by X-Ray Diffraction and TEM
| العنوان: | Structural Characterisation of Quantum Dots by X-Ray Diffraction and TEM |
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| المؤلفون: | Köhler, R., Neumann, W., Schmidbauer, M., Hanke, M., Grigoriev, D., Schäfer, P., Kirmse, H., Häusler, I., Schneider, R. |
| المساهمون: | Avouris, Phaedon, editorAff11, Bhushan, Bharat, editorAff12, Bimberg, Dieter, editorAff13, Aff17, von Klitzing, Klaus, editorAff14, Sakaki, Hiroyuki, editorAff15, Wiesendanger, Roland, editorAff16 |
| المصدر: | Semiconductor Nanostructures. :97-121 |
| قاعدة البيانات: | Springer Nature eBooks |
Full Text Finder | ردمك: | 9783540778981 9783540778998 |
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| DOI: | 10.1007/978-3-540-77899-8_5 |