كتاب إلكتروني
Off-axis electron holography and the FIB, a systematic study of the artefacts observed in semiconductor specimens
| العنوان: | Off-axis electron holography and the FIB, a systematic study of the artefacts observed in semiconductor specimens |
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| المؤلفون: | Cooper, D.Aff3, Ailliot, C.Aff3, Truche, R.Aff3, Hartmann, J.Aff3, Barnes, J.Aff3, Bertin, F.Aff3 |
| المساهمون: | Luysberg, Martina, editorAff1, Tillmann, Karsten, editorAff1, Weirich, Thomas, editorAff2 |
| المصدر: | EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany : Volume 1: Instrumentation and Methods. :251-252 |
| قاعدة البيانات: | Springer Nature eBooks |
Full Text Finder | ردمك: | 9783540851547 9783540851561 |
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| DOI: | 10.1007/978-3-540-85156-1_126 |