كتاب إلكتروني
Thickness Measurement of Thin Films by EPMA — Influence of ø(0), MAC’s and Substrate
| العنوان: | Thickness Measurement of Thin Films by EPMA — Influence of ø(0), MAC’s and Substrate |
|---|---|
| المؤلفون: | Pölt, PeterAff6, Stöckl, BerndAff6 |
| المساهمون: | Benoit, Daniele, editorAff1, Bresse, Jean-Francois, editorAff2, Van’t dack, Luc, editorAff3, Werner, Helmut, editorAff4, Wernisch, Johann, editorAff5 |
| المصدر: | Microbeam and Nanobeam Analysis. 13:463-471 |
| قاعدة البيانات: | Springer Nature eBooks |
Full Text Finder | ردمك: | 9783211828748 9783709165553 |
|---|---|
| DOI: | 10.1007/978-3-7091-6555-3_39 |