A Comparative Study of MOSFET (Single and Double Gate), Silicon Nanowire FET, and CNTFET by Varying the Oxide Thickness

التفاصيل البيبلوغرافية
العنوان:	A Comparative Study of MOSFET (Single and Double Gate), Silicon Nanowire FET, and CNTFET by Varying the Oxide Thickness
المؤلفون:	Jethwa, Mayank Kumar^Aff37, Devre, Hardiki Mukesh^Aff37, Agrawal, Yash^Aff37, Parekh, Rutu^Aff37
المساهمون:	Angrisani, Leopoldo, Series Editor^Aff1, Arteaga, Marco, Series Editor^Aff2, Panigrahi, Bijaya Ketan, Series Editor^Aff3, Chakraborty, Samarjit, Series Editor^Aff4, Chen, Jiming, Series Editor^Aff5, Chen, Shanben, Series Editor^Aff6, Chen, Tan Kay, Series Editor^Aff7, Dillmann, Rüdiger, Series Editor^Aff8, Duan, Haibin, Series Editor^Aff9, Ferrari, Gianluigi, Series Editor^Aff10, Ferre, Manuel, Series Editor^Aff11, Hirche, Sandra, Series Editor^Aff12, Jabbari, Faryar, Series Editor^Aff13, Jia, Limin, Series Editor^Aff14, Kacprzyk, Janusz, Series Editor^Aff15, Khamis, Alaa, Series Editor^Aff16, Kroeger, Torsten, Series Editor^Aff17, Li, Yong, Series Editor^Aff18, Liang, Qilian, Series Editor^Aff19, Martín, Ferran, Series Editor^Aff20, Ming, Tan Cher, Series Editor^Aff21, Minker, Wolfgang, Series Editor^Aff22, Misra, Pradeep, Series Editor^Aff23, Möller, Sebastian, Series Editor^Aff24, Mukhopadhyay, Subhas, Series Editor^Aff25, Ning, Cun-Zheng, Series Editor^Aff26, Nishida, Toyoaki, Series Editor^Aff27, Pascucci, Federica, Series Editor^Aff28, Qin, Yong, Series Editor^Aff29, Seng, Gan Woon, Series Editor^Aff30, Speidel, Joachim, Series Editor^Aff31, Veiga, Germano, Series Editor^Aff32, Wu, Haitao, Series Editor^Aff33, Zhang, Junjie James, Series Editor^Aff34, Nath, Vijay, editor^Aff35, Mandal, J. K., editor^Aff36
المصدر:	Proceeding of Fifth International Conference on Microelectronics, Computing and Communication Systems : MCCS 2020. 748:205-216
قاعدة البيانات:	Springer Nature eBooks

الوصف
ردمك:	9789811602740 9789811602757
DOI:	10.1007/978-981-16-0275-7_17