كتاب إلكتروني
Super-Resolution Methods for Wafer Transmission Electron Microscopy Images
العنوان: | Super-Resolution Methods for Wafer Transmission Electron Microscopy Images |
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المؤلفون: | Kim, SungsuAff28, Baek, InsungAff28, Cho, HansamAff28, Roh, HeejoongAff29, Kim, KyunghyeAff29, Jo, MunkiAff29, Tae, JaeungAff29, Kim, Seoung BumAff28 |
المساهمون: | Hartmanis, Juris, Founding EditorAff1, van Leeuwen, Jan, Series EditorAff2, Hutchison, David, Editorial Board MemberAff3, Kanade, Takeo, Editorial Board MemberAff4, Kittler, Josef, Editorial Board MemberAff5, Kleinberg, Jon M., Editorial Board MemberAff6, Kobsa, Alfred, Series EditorAff7, Mattern, Friedemann, Editorial Board MemberAff8, Mitchell, John C., Editorial Board MemberAff9, Naor, Moni, Editorial Board MemberAff10, Nierstrasz, Oscar, Series EditorAff11, Pandu Rangan, C., Editorial Board MemberAff12, Sudan, Madhu, Series EditorAff13, Terzopoulos, Demetri, Editorial Board MemberAff14, Tygar, Doug, Editorial Board MemberAff15, Weikum, Gerhard, Series EditorAff16, Vardi, Moshe Y, Series EditorAff17, Goos, Gerhard, Founding EditorAff18, Bertino, Elisa, Editorial Board MemberAff19, Gao, Wen, Editorial Board MemberAff20, Steffen, Bernhard, Editorial Board MemberAff21, Yung, Moti, Editorial Board MemberAff22, Woeginger, Gerhard, Editorial Board MemberAff23, Fujita, Hamido, editorAff24, Cimler, Richard, editorAff25, Hernandez-Matamoros, Andres, editorAff26, Ali, Moonis, editorAff27 |
المصدر: | Advances and Trends in Artificial Intelligence. Theory and Applications : 37th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2024, Hradec Kralove, Czech Republic, July 10–12, 2024, Proceedings. 14748:35-40 |
قاعدة البيانات: | Springer Nature eBooks |
ردمك: | 9789819746767 9789819746774 |
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DOI: | 10.1007/978-981-97-4677-4_4 |