كتاب إلكتروني
A Learning-Based Approach for Wafer Defect Detection in Production Quality Control
| العنوان: | A Learning-Based Approach for Wafer Defect Detection in Production Quality Control |
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| المؤلفون: | Yen, Hoang HaiAff13, Nguyen, Nguyen KhaiAff13, Tram, Pham BaoAff13, Vi, Tran DucAff13 |
| المساهمون: | Kacprzyk, Janusz, Series EditorAff1, Gomide, Fernando, Advisory EditorAff2, Kaynak, Okyay, Advisory EditorAff3, Liu, Derong, Advisory EditorAff4, Pedrycz, Witold, Advisory EditorAff5, Polycarpou, Marios M., Advisory EditorAff6, Rudas, Imre J., Advisory EditorAff7, Wang, Jun, Advisory EditorAff8, Nanda, Satyasai Jagannath, editorAff9, Yadav, Rajendra Prasad, editorAff10, Gandomi, Amir H., editorAff11, Saraswat, Mukesh, editorAff12 |
| المصدر: | Data Science and Applications : Proceedings of ICDSA 2023, Volume 1. 818:361-374 |
| قاعدة البيانات: | Springer Nature eBooks |
| ردمك: | 9789819978618 9789819978625 |
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| DOI: | 10.1007/978-981-99-7862-5_27 |