دورية أكاديمية
Improved techniques for sensitive area thickness determination in silicon detectors of ionizing readiation
| العنوان: | Improved techniques for sensitive area thickness determination in silicon detectors of ionizing readiation |
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| المؤلفون: | Nikitin, B. A., Zakharchuk, O. V., Nikolayeva, T. V. |
| المصدر: | Measurement Techniques. December 1986 29(12):1161-1163 |
| قاعدة البيانات: | Springer Nature Journals |
Find this article in full text from Springer Verlag. 
Full Text Finder | تدمد: | 05431972 15738906 |
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| DOI: | 10.1007/bf00866083 |