دورية أكاديمية
Exploring Influential Factors Affecting Baseplate Distortion and Residual Stress in Insulated-Gate Bipolar Transistor (IGBT) Modules During Reflow Soldering
| العنوان: | Exploring Influential Factors Affecting Baseplate Distortion and Residual Stress in Insulated-Gate Bipolar Transistor (IGBT) Modules During Reflow Soldering |
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| المؤلفون: | Gao, ShangAff1, IDs11664024113410_cor1, Teng, Chunzhuang, Wang, Haoxiang, Li, Honggang, Kang, Renke |
| المصدر: | Journal of Electronic Materials. :1-16 |
| قاعدة البيانات: | Springer Nature Journals |
Find this article in full text from Springer Verlag. 
Full Text Finder | تدمد: | 03615235 1543186X |
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| DOI: | 10.1007/s11664-024-11341-0 |