دورية أكاديمية
From Self-Organization of Monoatomic Steps on the Silicon Surface to Subnanometer Metrology
| العنوان: | From Self-Organization of Monoatomic Steps on the Silicon Surface to Subnanometer Metrology |
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| المؤلفون: | Sheglov, D. V.Aff1, Sitnikov, S. V., Fedina, L. I., Rogilo, D. I., Kozhukhov, A. S., Latyshev, A. V. |
| المصدر: | Optoelectronics, Instrumentation and Data Processing. 56(5):533-544 |
| قاعدة البيانات: | Springer Nature Journals |
Find this article in full text from Springer Verlag. 
Full Text Finder | تدمد: | 87566990 19347944 |
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| DOI: | 10.3103/s8756699020050118 |