دورية أكاديمية
Fast Anti-Random (FAR) Test Generation to Improve the Quality of Behavioral Model Verification
| العنوان: | Fast Anti-Random (FAR) Test Generation to Improve the Quality of Behavioral Model Verification |
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| المؤلفون: | Chen, Tom, Bai, Andre, Hajjar, Amjad, Andrews, Anneliese K. Amschler, Anderson, C. |
| المصدر: | Journal of Electronic Testing: Theory and Applications. December 2002 18(6):583-594 |
| قاعدة البيانات: | Springer Nature Journals |
Find this article in full text from Springer Verlag. 
Full Text Finder | تدمد: | 09238174 15730727 |
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| DOI: | 10.1023/a:1020844805564 |