دورية أكاديمية
Investigation of Characteristics of Al2O3/n-In x Ga1−x As (x = 0.53, 0.7, and 1) Metal–Oxide–Semiconductor Structures
| العنوان: | Investigation of Characteristics of Al |
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| المؤلفون: | Trinh, Hai-Dang, Lin, Yueh-Chin, Kuo, Chien-I, Chang, Edward Yi, Nguyen, Hong-Quan, Wong, Yuen-Yee, Yu, Chih-Chieh, Chen, Chi-Ming, Chang, Chia-Yuan, Wu, Jyun-Yi, Chiu, Han-Chin, Yu, Terrence, Chang, Hui-Cheng, Tsai, Joseph, Hwang, David |
| المصدر: | Journal of Electronic Materials. August 2013 42(8):2439-2444 |
| قاعدة البيانات: | Springer Nature Journals |
Find this article in full text from Springer Verlag. 
Full Text Finder | تدمد: | 03615235 1543186X |
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| DOI: | 10.1007/s11664-013-2616-x |