دورية أكاديمية
In Situ Reflection Electron Microscopy for the Analysis of Silicon Surface Processes: Sublimation, Electromigration, and Adsorption of Impurity Atoms
| العنوان: | In Situ Reflection Electron Microscopy for the Analysis of Silicon Surface Processes: Sublimation, Electromigration, and Adsorption of Impurity Atoms |
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| المؤلفون: | Rogilo, D. I.Aff1, Sitnikov, S. V., Rodyakina, E. E., Petrov, A. S., Ponomarev, S. A., Sheglov, D. V., Fedina, L. I., Latyshev, A. V. |
| المصدر: | Crystallography Reports. 66(4):570-580 |
| قاعدة البيانات: | Springer Nature Journals |
Find this article in full text from Springer Verlag. 
Full Text Finder | تدمد: | 10637745 1562689X |
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| DOI: | 10.1134/s1063774521040192 |