دورية أكاديمية
An Apertureless Scanning Near-Field Optical Microscope Probe with a Lateral Resolution of 10 – 15 nm Observed with a Semiconductor Structure
العنوان: | An Apertureless Scanning Near-Field Optical Microscope Probe with a Lateral Resolution of 10 – 15 nm Observed with a Semiconductor Structure |
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المؤلفون: | Kazantsev, D. V.Aff1, Aff2, Aff3, IDs10946023101742_cor1, Klekovkin, A. V., Minaev, I. I., Kazantseva, E. A., Nikolaev, S. N. |
المصدر: | Journal of Russian Laser Research. 44(6):656-662 |
قاعدة البيانات: | Springer Nature Journals |
تدمد: | 10712836 15738760 |
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DOI: | 10.1007/s10946-023-10174-2 |