دورية أكاديمية
An Apertureless Scanning Near-Field Optical Microscope Probe with a Lateral Resolution of 10 – 15 nm Observed with a Semiconductor Structure
| العنوان: | An Apertureless Scanning Near-Field Optical Microscope Probe with a Lateral Resolution of 10 – 15 nm Observed with a Semiconductor Structure |
|---|---|
| المؤلفون: | Kazantsev, D. V.Aff1, Aff2, Aff3, IDs10946023101742_cor1, Klekovkin, A. V., Minaev, I. I., Kazantseva, E. A., Nikolaev, S. N. |
| المصدر: | Journal of Russian Laser Research. 44(6):656-662 |
| قاعدة البيانات: | Springer Nature Journals |
Find this article in full text from Springer Verlag. 
Full Text Finder | تدمد: | 10712836 15738760 |
|---|---|
| DOI: | 10.1007/s10946-023-10174-2 |