دورية أكاديمية
Life Testing and Reliability Behavior of Gan/Ingan/Aigan Light-Emitting Diodes
| العنوان: | Life Testing and Reliability Behavior of Gan/Ingan/Aigan Light-Emitting Diodes |
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| المؤلفون: | Osinski, M.Aff146, Barton, D. L., Helms, C. J., Berg, N. H., Seager, C. H. |
| المصدر: | MRS Online Proceedings Library. 531(1):385-390 |
| قاعدة البيانات: | Springer Nature Journals |
Find this article in full text from Springer Verlag. | تدمد: | 02729172 19464274 |
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| DOI: | 10.1557/proc-531-385 |