دورية أكاديمية
An XPS depth-profile study on electrochemically deposited TaO x
| العنوان: | An XPS depth-profile study on electrochemically deposited TaO |
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| المؤلفون: | Moo, James Guo Sheng, Awaludin, Zaenal, Okajima, Takeyoshi, Ohsaka, Takeo |
| المصدر: | Journal of Solid State Electrochemistry: Current Research and Developmentin Science and Technology. December 2013 17(12):3115-3123 |
| قاعدة البيانات: | Springer Nature Journals |
Find this article in full text from Springer Verlag. 
Full Text Finder | تدمد: | 14328488 14330768 |
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| DOI: | 10.1007/s10008-013-2216-y |