دورية أكاديمية
On the characterisation of grown-in defects in Czochralski-grown Si and Ge
| العنوان: | On the characterisation of grown-in defects in Czochralski-grown Si and Ge |
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| المؤلفون: | Vanhellemont, J., Van Steenbergen, J., Holsteyns, F., Roussel, P., Meuris, M., Młynarczyk, K., Śpiewak, P., Geens, W., Romandic, I. |
| المصدر: | Journal of Materials Science: Materials in Electronics. December 2008 19(1):24-31 |
| قاعدة البيانات: | Springer Nature Journals |
Find this article in full text from Springer Verlag. 
Full Text Finder | تدمد: | 09574522 1573482X |
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| DOI: | 10.1007/s10854-008-9579-3 |