دورية أكاديمية
High-resolution x-ray diffraction study of In0.25Ga0.75Sb/InAs superlattice
| العنوان: | High-resolution x-ray diffraction study of In |
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| المؤلفون: | Vigliante, A., Homma, H., Zborowski, J. T., Golding, T. D., Moss, S. C. |
| المصدر: | Journal of Materials Research. 14(5):1744-1751 |
| قاعدة البيانات: | Springer Nature Journals |
Find this article in full text from Springer Verlag. 
Full Text Finder | تدمد: | 08842914 20445326 |
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| DOI: | 10.1557/jmr.1999.0236 |