دورية أكاديمية
Quantitative depth profile analysis of high-Tc-superconductors with sputtered neutral mass spectrometry (SNMS)
| العنوان: | Quantitative depth profile analysis of high-T |
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| Alternate Title: | Quantitative Tiefenprofilanalyse von HT |
| المؤلفون: | Peters, H., Skoda, L., Crecelius, G., Adrian, H. |
| المصدر: | Fresenius' Zeitschrift für analytische Chemie. January 1989 333(4-5):343-345 |
| قاعدة البيانات: | Springer Nature Journals |
Find this article in full text from Springer Verlag. 
Full Text Finder | تدمد: | 00161152 16182650 |
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| DOI: | 10.1007/bf00572324 |