دورية أكاديمية
Time-Dependent Bias Stress-Induced Instability of SiC MOS Devices
| العنوان: | Time-Dependent Bias Stress-Induced Instability of SiC MOS Devices |
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| المؤلفون: | Lelis, Aivars, Habersat, Daniel, Olaniran, Fatimat, Simons, Brian, McGarrity, James, McLean, F. Barry, Goldsman, Neil |
| المصدر: | MRS Online Proceedings Library. 911(1) |
| قاعدة البيانات: | Springer Nature Journals |
Find this article in full text from Springer Verlag. | تدمد: | 02729172 19464274 |
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| DOI: | 10.1557/proc-0911-b13-05 |