دورية أكاديمية
Influence of Si3N4 passivation on surface trapping in SiC metal-semiconductor field-effect transistors
| العنوان: | Influence of Si |
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| المؤلفون: | Cha, Ho-Young, Choi, Y. C., Thompson, R. M., Kaper, V., Shealy, J. R., Eastman, L. F., Spencer, M. G. |
| المصدر: | Journal of Electronic Materials. August 2004 33(8):908-911 |
| قاعدة البيانات: | Springer Nature Journals |
Find this article in full text from Springer Verlag. 
Full Text Finder | تدمد: | 03615235 1543186X |
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| DOI: | 10.1007/s11664-004-0219-2 |