دورية أكاديمية
Tetracene film morphology: Comparative atomic force microscopy, X-ray diffraction and ellipsometry investigations
| العنوان: | Tetracene film morphology: Comparative atomic force microscopy, X-ray diffraction and ellipsometry investigations |
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| المؤلفون: | Gompf, B., Faltermeier, D., Redling, C., Dressel, M., Pflaum, J. |
| المصدر: | The European Physical Journal E: Soft Matter. December 2008 27(4):421-424 |
| قاعدة البيانات: | Springer Nature Journals |
Find this article in full text from Springer Verlag. 
Full Text Finder | تدمد: | 12928941 1292895X |
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| DOI: | 10.1140/epje/i2008-10405-5 |