دورية أكاديمية
Characterization of AlInN/AlN/GaN Heterostructures with Different AlN Buffer Thickness
| العنوان: | Characterization of AlInN/AlN/GaN Heterostructures with Different AlN Buffer Thickness |
|---|---|
| المؤلفون: | Çörekçi, S., Dugan, S., Öztürk, M. K., Çetin, S. Ş., Çakmak, M., Özçelik, S., Özbay, E. |
| المصدر: | Journal of Electronic Materials. July 2016 45(7):3278-3284 |
| قاعدة البيانات: | Springer Nature Journals |
Find this article in full text from Springer Verlag. 
Full Text Finder | تدمد: | 03615235 1543186X |
|---|---|
| DOI: | 10.1007/s11664-016-4536-z |