دورية أكاديمية
Strain-engineered rippling at the bilayer-MoS2 interface identified by advanced atomic force microscopy
| العنوان: | Strain-engineered rippling at the bilayer-MoS |
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| المؤلفون: | Dong, HaoyuAff1, Aff2, Li, SongyangAff1, Aff2, Mi, ShuoAff1, Aff2, Guo, JianfengAff1, Aff2, Suonan, ZhaxiAff1, Aff2, Wu, HanxiangAff1, Aff2, Geng, YanyanAff1, Aff2, Wang, ManyuAff1, Aff2, Xu, HuiwenAff1, Aff2, Guan, Li, Pang, FeiAff1, Aff2, Ji, WeiAff1, Aff2, Xu, RuiAff1, Aff2, IDs1146702414094_cor13, Cheng, ZhihaiAff1, Aff2, IDs1146702414094_cor14 |
| المصدر: | Frontiers of Physics. 19(6) |
| قاعدة البيانات: | Springer Nature Journals |
Find this article in full text from Springer Verlag. 
Full Text Finder | تدمد: | 20950462 20950470 |
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| DOI: | 10.1007/s11467-024-1409-4 |