دورية أكاديمية
X-ray Diffraction Analysis of the Structure In0.53Ga0.47As Films Grown on (100) and (111)A GaAs Substrates with a Metamorphic Buffer
العنوان: | X-ray Diffraction Analysis of the Structure In |
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المؤلفون: | Folomeshkin, M. S.Aff1, Aff2, IDS1063774522030075_cor1, Volkovsky, Yu. A.Aff1, Aff2, Prosekov, P. A.Aff1, Aff2, Galiev, G. B., Klimov, E. A., Klochkov, A. N., Pushkarev, S. S., Seregin, A. Yu.Aff1, Aff2, Pisarevsky, Yu. V.Aff1, Aff2, Blagov, A. E.Aff1, Aff2, Kovalchuk, M. V.Aff1, Aff2, Aff4 |
المصدر: | Crystallography Reports. 67(3):317-322 |
قاعدة البيانات: | Springer Nature Journals |
تدمد: | 10637745 1562689X |
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DOI: | 10.1134/s1063774522030075 |