دورية أكاديمية
Lpe highly perfect ingaasp/lnp structure characterization by x-ray double crystal diffractometry
| العنوان: | Lpe highly perfect ingaasp/lnp structure characterization by x-ray double crystal diffractometry |
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| المؤلفون: | Bocchi, C., Ferrari, C., Franzosi, P., Fornuto, G., Pellegrino, S., Taiariol, F. |
| المصدر: | Journal of Electronic Materials. July 1987 16(4):245-250 |
| قاعدة البيانات: | Springer Nature Journals |
Find this article in full text from Springer Verlag. 
Full Text Finder | تدمد: | 03615235 1543186X |
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| DOI: | 10.1007/bf02653361 |