دورية أكاديمية

Algorithm for Monitoring Optical Coating Sputter Deposition Based on Broadband Measurement Sample Data

التفاصيل البيبلوغرافية
العنوان: Algorithm for Monitoring Optical Coating Sputter Deposition Based on Broadband Measurement Sample Data
المؤلفون: Shinkarev, V. D.Aff1, IDS1990478923030146_cor1, Lukyanenko, D. V.Aff1, IDS1990478923030146_cor2, Tikhonravov, A. V.Aff1, IDS1990478923030146_cor3, Yagola, A. G.Aff1, IDS1990478923030146_cor4
المصدر: Journal of Applied and Industrial Mathematics. 17(3):608-615
قاعدة البيانات: Springer Nature Journals
الوصف
تدمد:19904789
19904797
DOI:10.1134/s1990478923030146