دورية أكاديمية
AFM, ellipsometry, XPS and TEM on ultra-thin oxide/polymer nanocomposite layers in organic thin film transistors
| العنوان: | AFM, ellipsometry, XPS and TEM on ultra-thin oxide/polymer nanocomposite layers in organic thin film transistors |
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| المؤلفون: | Fian, A., Haase, A., Stadlober, B., Jakopic, G., Matsko, N. B., Grogger, W., Leising, G. |
| المصدر: | Analytical and Bioanalytical Chemistry. March 2008 390(6):1455-1461 |
| قاعدة البيانات: | Springer Nature Journals |
Find this article in full text from Springer Verlag. 
Full Text Finder | تدمد: | 16182642 16182650 |
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| DOI: | 10.1007/s00216-007-1663-7 |