دورية أكاديمية
Сomposition Depth Profiling of the GaAs Native Oxide Irradiated by an Ar+ Ion Beam
| العنوان: | Сomposition Depth Profiling of the GaAs Native Oxide Irradiated by an Ar+ Ion Beam |
|---|---|
| المؤلفون: | Mikoushkin, V. M.Aff1, Bryzgalov, V. V., Makarevskaya, E. A., Solonitsyna, A. P., Marchenko, D.E. |
| المصدر: | Semiconductors. 52(16):2057-2060 |
| قاعدة البيانات: | Springer Nature Journals |
Find this article in full text from Springer Verlag. 
Full Text Finder | تدمد: | 10637826 10906479 |
|---|---|
| DOI: | 10.1134/s1063782618160194 |