دورية أكاديمية

Impact of Cu Pillar Bump Diameter and Solder Material on Reflow Soldering: A Computational Study with Thermal Fluid–Structure Interaction

التفاصيل البيبلوغرافية
العنوان: Impact of Cu Pillar Bump Diameter and Solder Material on Reflow Soldering: A Computational Study with Thermal Fluid–Structure Interaction
المؤلفون: Lee, Jing Rou, Abdul Aziz, Mohd SharizalAff1, IDs11664023108553_cor2, Khor, Chu Yee, Ishak, Mohammad Hafifi Hafiz, Kamarudin, Roslan, Ani, F. Che
المصدر: Journal of Electronic Materials. 53(3):1201-1213
قاعدة البيانات: Springer Nature Journals
الوصف
تدمد:03615235
1543186X
DOI:10.1007/s11664-023-10855-3