دورية أكاديمية
SIMS of Organic Materials—Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary Ions
| العنوان: | SIMS of Organic Materials—Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary Ions |
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| المؤلفون: | Havelund, R.Aff1, Seah, M. P., Tiddia, M., Gilmore, I. S. |
| المصدر: | Journal of The American Society for Mass Spectrometry: The official journal of The American Society for Mass Spectrometry . 29(4):774-785 |
| قاعدة البيانات: | Springer Nature Journals |
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Full Text Finder | تدمد: | 10440305 18791123 |
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| DOI: | 10.1007/s13361-018-1905-2 |