دورية أكاديمية
Method for Determining the Most Sensitive Region of an Optocoupler Chip under X-ray-Induced Dose Effects
| العنوان: | Method for Determining the Most Sensitive Region of an Optocoupler Chip under X-ray-Induced Dose Effects |
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| المؤلفون: | Chernyak, M. E.Aff1, Ranneva, E. V., Ulanova, A. V.Aff1, Aff2, Nikiforov, A. Yu., Verizhnikov, A. I., Tsyrlov, A. M., Fedosov, V. S., Shchepanov, A. N., Kalashnikov, V. D., Titovets, D. O. |
| المصدر: | Russian Microelectronics. 48(6):415-421 |
| قاعدة البيانات: | Springer Nature Journals |
Find this article in full text from Springer Verlag. 
Full Text Finder | تدمد: | 10637397 16083415 |
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| DOI: | 10.1134/s1063739719060039 |