Investigation of Near-IR Emission from Hydrogenated Nanocrystalline Silicon - The Oxygen Defect Band

التفاصيل البيبلوغرافية
العنوان: Investigation of Near-IR Emission from Hydrogenated Nanocrystalline Silicon - The Oxygen Defect Band
المساهمون: Yue, G.
المصدر: Conference: Materials Research Society Symposium, 5-9 April 2010, San Francisco, California; Other Information: Amorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2010: Proceedings of the Materials Research Society Symposium, 5-9 April 2010, San Francisco, California
وصف الملف: Medium: X
URL الوصول: http://www.osti.gov/scitech/biblio/1255188
قاعدة البيانات: SciTech Connect
الوصف
DOI:10.1557/PROC-1245-A13-01